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Is it possible to calculate patial overlap between detachment and attachment densities (φS Descriptor) as described in J. Chem. Theory Comput. 2014, 10, 3896−3905.
Thanks for the support.
Justin
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You can use Multiwfn to compute Sr and Sm indices defined in my hole-electron analysis theory to study overlap between hole and electron distributions, they are quite useful, see Section 3.21.1 of Multiwfn manual for introduction (shown below) and Section 4.18.1 for example of calculation.
Best regards,
Tian
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Thank you Prof. Lu Tian for your suggestion. I have been using recently Multiwfn for the calculation of Sr and Sm and related indices.
It appears that you have not included the PhiS index calculation in Multiwfn. It is fine.
Thanks again.
Justin
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I understand. Thank you very much.
Justin
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